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MAUD: Materials Analysis Using Diffraction

Maud is an a Rietveld extended program to perform the combined analysis. It can be used to fit diffraction, fluorescence and reflectivity data using X-ray, neutron, TOF or electrons.

List of MAUD features, as copied from the MAUD homepage

Written in Java can run on Windows, MacOSX, Linux, Unix (needs Java VM 1.7 or later)
Easy to use, every action is controlled by a GUI
Works with X-ray, synchrotron, Neutron, TOF and electrons
Developed for Rietveld analysis, simultaneous multi spectra and different instruments/techniques supported
Ab-initio structure solution integration, from peak finding, indexing to solving
Different optimization algorithms available (Least Squares, Evolutionary, Simulated Annealing, Metadynamics, Simplex, Lamarckian…)
Le Bail fitting
Quantitative phase analysis wizard
Microstructure analysis (size-strain, anisotropy, planar defects, turbostratic disorder and distributions included)
Texture and residual stress analysis using part or full spectra
MEEM and superflip algorithm for Electron Density Maps and fitting
Thin film and multilayer aware; film thickness and absorption models
Reflectivity fitting by different models, from Parratt (Matrix) to Discrete Born Approximation
Fluorescence full pattern fitting based on crystal structure models (XRF and GIXRF full quantification)
Works with TEM diffraction images and electron scattering
Several datafile input formats
Works with images from 2D detectors (image plates, CCDs, flat or curved), integration and calibration included
CIF compliance for input/output; import structures from databases
Many other features…look at the Maud in action page.

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MAUD: Materials Analysis Using Diffraction

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