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software:maud

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MAUD: Materials Analysis Using Diffraction

Maud is an a Rietveld extended program to perform the combined analysis. It can be used to fit diffraction, fluorescence and reflectivity data using X-ray, neutron, TOF or electrons.

List of MAUD features, as copied from the MAUD homepage

  • Written in Java can run on Windows, MacOSX, Linux, Unix (needs Java VM 1.7 or later)
  • Easy to use, every action is controlled by a GUI
  • Works with X-ray, synchrotron, Neutron, TOF and electrons
  • Developed for Rietveld analysis, simultaneous multi spectra and different instruments/techniques supported
  • Ab-initio structure solution integration, from peak finding, indexing to solving
  • Different optimization algorithms available (Least Squares, Evolutionary, Simulated Annealing, Metadynamics, Simplex, Lamarckian…)
  • Le Bail fitting
  • Quantitative phase analysis wizard
  • Microstructure analysis (size-strain, anisotropy, planar defects, turbostratic disorder and distributions included)
  • Texture and residual stress analysis using part or full spectra
  • MEEM and superflip algorithm for Electron Density Maps and fitting
  • Thin film and multilayer aware; film thickness and absorption models
  • Reflectivity fitting by different models, from Parratt (Matrix) to Discrete Born Approximation
  • Fluorescence full pattern fitting based on crystal structure models (XRF and GIXRF full quantification)
  • Works with TEM diffraction images and electron scattering
  • Several datafile input formats
  • Works with images from 2D detectors (image plates, CCDs, flat or curved), integration and calibration included
  • CIF compliance for input/output; import structures from databases
  • Many other features…look at the Maud in action page.
software/maud.1550244960.txt.gz · Last modified: 2019/02/18 10:11 (external edit)